@misc{indiciae9561c1f57da3,
  title = {Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE},
  author = {Sara Sacchi and Bappaditya Dey and Iacopo Mochi and Sandip Halder and Philippe Leray},
  year = {2023},
  url = {https://arxiv.org/abs/2310.14815},
  note = {Source identifier: 2310.14815}
}