TY  - RPRT
TI  - Breakdown Performance of Guard Ring Designs for Pixel Detectors in $150~\mathrm{nm}$ CMOS Technology
AU  - Sinuo Zhang
AU  - Ivan Caicedo
AU  - Tomasz Hemperek
AU  - Toko Hirono
AU  - Jochen Dingfelder
PY  - 2024
UR  - https://arxiv.org/abs/2310.15717
ID  - 2310.15717
ER  -