@misc{indiciaebe4c94cc6aa9,
  title = {Non-Destructive Imaging of Breakdown Process in Ferroelectric Capacitors Using \textbackslash{}textit\{In-situ\} Laser-Based Photoemission Electron Microscopy},
  author = {Hirokazu Fujiwara and Yuki Itoya and Masaharu Kobayashi and Cédric Bareille and Shik Shin and Toshiyuki Taniuchi},
  year = {2023},
  doi = {10.1063/5.0162484},
  url = {https://arxiv.org/abs/2310.16275},
  note = {Source identifier: 2310.16275}
}