TY  - RPRT
TI  - Non-Destructive Imaging of Breakdown Process in Ferroelectric Capacitors Using \textit{In-situ} Laser-Based Photoemission Electron Microscopy
AU  - Hirokazu Fujiwara
AU  - Yuki Itoya
AU  - Masaharu Kobayashi
AU  - Cédric Bareille
AU  - Shik Shin
AU  - Toshiyuki Taniuchi
PY  - 2023
DO  - 10.1063/5.0162484
UR  - https://arxiv.org/abs/2310.16275
ID  - 2310.16275
ER  -