@misc{indiciaec1e292f82521,
  title = {Unveiling microstructural damage for leakage current degradation in SiC Schottky diode after heavy ions irradiation under 200 V},
  author = {Xiaoyu Yan and Pengfei Zhai and Chen Yang and Shiwei Zhao and Shuai Nan and Peipei Hu and Teng Zhang and Qiyu Chen and Lijun Xu and Zongzhen Li and Jie Liu},
  year = {2024},
  doi = {10.1063/5.0216883},
  url = {https://arxiv.org/abs/2310.17145},
  note = {Source identifier: 2310.17145}
}