@misc{indiciae4e114f15dc52,
  title = {Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability},
  author = {Shi-Shun Chen and Xiao-Yang Li and Wenrui Xie},
  year = {2025},
  doi = {10.1016/j.apm.2024.115788},
  url = {https://arxiv.org/abs/2310.18567},
  note = {Source identifier: 2310.18567}
}