TY  - RPRT
TI  - Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability
AU  - Shi-Shun Chen
AU  - Xiao-Yang Li
AU  - Wenrui Xie
PY  - 2025
DO  - 10.1016/j.apm.2024.115788
UR  - https://arxiv.org/abs/2310.18567
ID  - 2310.18567
ER  -