TY  - RPRT
TI  - Interfacial defect properties of high-entropy carbides: Stacking faults, Shockley partial dislocations, and a new Evans-Polanyi-Semenov relation
AU  - Samuel E. Daigle
AU  - Stefano Curtarolo
AU  - William G. Fahrenholtz
AU  - Jon-Paul Maria
AU  - Douglas E. Wolfe
AU  - Eva Zurek
AU  - Donald W. Brenner
PY  - 2024
UR  - https://arxiv.org/abs/2311.00834
ID  - 2311.00834
ER  -