TY  - RPRT
TI  - Assessing the SCAN functional for deep defects and small polarons in wide-bandgap semiconductors and insulators
AU  - Darshana Wickramaratne
AU  - John L. Lyons
PY  - 2024
UR  - https://arxiv.org/abs/2311.03634
ID  - 2311.03634
ER  -