@misc{indiciae34801d6e0d28,
  title = {Shot noise-mitigated secondary electron imaging with ion count-aided microscopy},
  author = {Akshay Agarwal and Leila Kasaei and Xinglin He and Ruangrawee Kitichotkul and Oguz Kagan Hitit and Minxu Peng and J. Albert Schultz and Leonard C. Feldman and Vivek K Goyal},
  year = {2024},
  doi = {10.1073/pnas.2401246121},
  url = {https://arxiv.org/abs/2311.07003},
  note = {Source identifier: 2311.07003}
}