@misc{indiciae0ba458706fae,
  title = {Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy},
  author = {Vic De Ridder and Bappaditya Dey and Victor Blanco and Sandip Halder and Bartel Van Waeyenberge},
  year = {2023},
  url = {https://arxiv.org/abs/2311.11439},
  note = {Source identifier: 2311.11439}
}