TY  - RPRT
TI  - Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy
AU  - Vic De Ridder
AU  - Bappaditya Dey
AU  - Victor Blanco
AU  - Sandip Halder
AU  - Bartel Van Waeyenberge
PY  - 2023
UR  - https://arxiv.org/abs/2311.11439
ID  - 2311.11439
ER  -