@misc{indiciae405eec4a8e4f,
  title = {Single-image based deep learning for precise atomic defects identification},
  author = {Kangshu Li and Xiaocang Han and Yanhui Hong and Yuan Meng and Xiang Chen and Junxian Li and Jing-Yang You and Lin Yao and Wenchao Hu and Zhiyi Xia and Guolin Ke and Linfeng Zhang and Jin Zhang and Xiaoxu Zhao},
  year = {2023},
  url = {https://arxiv.org/abs/2311.14936},
  note = {Source identifier: 2311.14936}
}