TY  - RPRT
TI  - Test-negative designs with various reasons for testing: statistical bias and solution
AU  - Mengxin Yu
AU  - Tom Hongyi Liu
AU  - Kendrick Qijun Li
AU  - Nicholas Jewell
AU  - Eric Tchetgen Tchetgen
AU  - Dylan Small
AU  - Xu Shi
AU  - Bingkai Wang
PY  - 2025
UR  - https://arxiv.org/abs/2312.03967
ID  - 2312.03967
ER  -