TY  - RPRT
TI  - Investigating intrinsic silicon oxide and a lightly doped p-type layer for evolution of tail states and estimating its impact as a passivation layer in a HIT type device
AU  - S M Iftiquar
PY  - 2023
DO  - 10.1007/s12633-023-02787-8
UR  - https://arxiv.org/abs/2312.06111
ID  - 2312.06111
ER  -