TY  - RPRT
TI  - The impact of bias row noise to photometric accuracy: case study based on a scientific CMOS detector
AU  - Li Shao
AU  - Hu Zhan
AU  - Chao Liu
AU  - Haonan Chi
AU  - Qiuyan Luo
AU  - Huaipu Mu
AU  - Wenzhong Shi
PY  - 2023
DO  - 10.1088/1674-4527/ad1793
UR  - https://arxiv.org/abs/2312.13539
ID  - 2312.13539
ER  -