@misc{indiciae3aa595f0069c,
  title = {Boosting Defect Detection in Manufacturing using Tensor Convolutional Neural Networks},
  author = {Pablo Martin-Ramiro and Unai Sainz de la Maza and Sukhbinder Singh and Roman Orus and Samuel Mugel},
  year = {2024},
  url = {https://arxiv.org/abs/2401.01373},
  note = {Source identifier: 2401.01373}
}