@misc{indiciae93cf6733f8c9,
  title = {Site-Specific Plan-view (S)TEM Sample Preparation from Thin Films using a Dual-Beam FIB-SEM},
  author = {Supriya Ghosh and Fengdeng Liu and Sreejith Nair and Bharat Jalan and K. Andre Mkhoyan},
  year = {2024},
  url = {https://arxiv.org/abs/2401.02538},
  note = {Source identifier: 2401.02538}
}