@misc{indiciae857593e2d227,
  title = {Time-Dependent Dielectric Breakdown on Subnanometer EOT nMOS FinFETs},
  author = {Pedro C. Feijoo and Thomas Kauerauf and María Toledano-Luque and Mitsuhiro Togo and Enrique San Andrés and Guido Groeseneken},
  year = {2024},
  doi = {10.1109/tdmr.2011.2180387},
  url = {https://arxiv.org/abs/2402.00886},
  note = {Source identifier: 2402.00886}
}