TY  - RPRT
TI  - Standardization of chemically selective atomic force microscopy for metal-oxide surfaces
AU  - Philipp Wiesener
AU  - Stefan Förster
AU  - Milena Merkel
AU  - Bertram Schulze Lammers
AU  - Harald Fuchs
AU  - Saeed Amirjalayer
AU  - Harry Mönig
PY  - 2024
DO  - 10.1021/acsnano.4c03155
UR  - https://arxiv.org/abs/2402.11045
ID  - 2402.11045
ER  -