@misc{indiciae85aa36bde8b7,
  title = {Robust single divacancy defects near stacking faults in 4H-SiC under resonant excitation},
  author = {Zhen-Xuan He and Ji-Yang Zhou and Wu-Xi Lin and Qiang Li and Rui-Jian Liang and Jun-Feng Wang and Xiao-Lei Wen and Zhi-He Hao and Wei Liu and Shuo Ren and Hao Li and Li-Xing You and Jian-Shun Tang and Jin-Shi Xu and Chuan-Feng Li and Guang-Can Guo},
  year = {2024},
  url = {https://arxiv.org/abs/2402.12999},
  note = {Source identifier: 2402.12999}
}