@misc{indiciaea512dd003a4b,
  title = {Characterization of the low electric field and zero-temperature two-level-system loss in hydrogenated amorphous silicon},
  author = {Fabien Defrance and Andrew D. Beyer and Shibo Shu and Jack Sayers and Sunil R. Golwala},
  year = {2024},
  doi = {10.1103/physrevmaterials.8.035602},
  url = {https://arxiv.org/abs/2403.03534},
  note = {Source identifier: 2403.03534}
}