TY  - RPRT
TI  - Characterization of the low electric field and zero-temperature two-level-system loss in hydrogenated amorphous silicon
AU  - Fabien Defrance
AU  - Andrew D. Beyer
AU  - Shibo Shu
AU  - Jack Sayers
AU  - Sunil R. Golwala
PY  - 2024
DO  - 10.1103/physrevmaterials.8.035602
UR  - https://arxiv.org/abs/2403.03534
ID  - 2403.03534
ER  -