@misc{indiciae31a88caf10e1,
  title = {Simulating Charged Defects at Database Scale},
  author = {Jimmy-Xuan Shen and Lars F. Voss and Joel Basile Varley},
  year = {2024},
  url = {https://arxiv.org/abs/2403.05689},
  note = {Source identifier: 2403.05689}
}