TY  - RPRT
TI  - New insights into the origin of the first sharp diffraction peak in amorphous silica from an analysis of chemical and radial ordering
AU  - Parthapratim Biswas
AU  - Devilal Dahal
AU  - Stephen R. Elliott
PY  - 2024
UR  - https://arxiv.org/abs/2403.10632
ID  - 2403.10632
ER  -