@misc{indiciaeea6f7a5ce38e,
  title = {Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials},
  author = {Amit Singh and Seunghan Lee and Hyeonhu Bae and Jahyun Koo and Li Yang and Hoonkyung Lee},
  year = {2024},
  doi = {10.1039/c9ra07700f},
  url = {https://arxiv.org/abs/2403.11140},
  note = {Source identifier: 2403.11140}
}