TY  - RPRT
TI  - Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials
AU  - Amit Singh
AU  - Seunghan Lee
AU  - Hyeonhu Bae
AU  - Jahyun Koo
AU  - Li Yang
AU  - Hoonkyung Lee
PY  - 2024
DO  - 10.1039/c9ra07700f
UR  - https://arxiv.org/abs/2403.11140
ID  - 2403.11140
ER  -