@misc{indiciaee8d2f36e0acd,
  title = {Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy},
  author = {Amrit Laudari and Sameera Pathiranage and Salim A. Thomas and Reed J. Petersen and Kenneth J. Anderson and Todd A. Pringle and Erik K. Hobbie and Nuri Oncel},
  year = {2024},
  doi = {10.1063/5.0090166},
  url = {https://arxiv.org/abs/2403.14865},
  note = {Source identifier: 2403.14865}
}