@misc{indiciae6065bf5ce78d,
  title = {A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy},
  author = {Carlos Munoz and Thomas Iken and Nuri Oncel},
  year = {2024},
  doi = {10.1063/5.0169974},
  url = {https://arxiv.org/abs/2403.14867},
  note = {Source identifier: 2403.14867}
}