TY  - RPRT
TI  - A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy
AU  - Carlos Munoz
AU  - Thomas Iken
AU  - Nuri Oncel
PY  - 2024
DO  - 10.1063/5.0169974
UR  - https://arxiv.org/abs/2403.14867
ID  - 2403.14867
ER  -