TY  - RPRT
TI  - Development of a full-Scale approach to predict overlay reflective crack
AU  - Zehui Zhu
AU  - Imad L. Al-Qadi
PY  - 2024
DO  - 10.1080/10298436.2024.2310095
UR  - https://arxiv.org/abs/2403.20141
ID  - 2403.20141
ER  -