TY  - RPRT
TI  - Morphological stability of electrostrictive thin films
AU  - Jin Zhang
AU  - Peter W. Voorhees
PY  - 2024
DO  - 10.1016/j.ijengsci.2024.104073
UR  - https://arxiv.org/abs/2404.05093
ID  - 2404.05093
ER  -