TY  - RPRT
TI  - Towards an understanding of particle-scale flaws and microstructure evolution in cold-spray via accumulation of single particle impacts
AU  - Alain Reiser
AU  - Christopher Allan Schuh
PY  - 2024
UR  - https://arxiv.org/abs/2404.05601
ID  - 2404.05601
ER  -