TY  - RPRT
TI  - Method for efficient large-scale cryogenic characterization of CMOS technologies
AU  - Jonathan Eastoe
AU  - Grayson M. Noah
AU  - Debargha Dutta
AU  - Alessandro Rossi
AU  - Jonathan D. Fletcher
AU  - Alberto Gomez-Saiz
PY  - 2024
DO  - 10.1109/tim.2024.3497143
UR  - https://arxiv.org/abs/2404.11451
ID  - 2404.11451
ER  -