TY  - RPRT
TI  - Understanding Optimal Feature Transfer via a Fine-Grained Bias-Variance Analysis
AU  - Yufan Li
AU  - Subhabrata Sen
AU  - Ben Adlam
PY  - 2025
UR  - https://arxiv.org/abs/2404.12481
ID  - 2404.12481
ER  -