TY  - RPRT
TI  - Influence of strain and point defects on the electronic structure and related properties of (111)NiO epitaxial films
AU  - Bhabani Prasad Sahu
AU  - Poonam Sharma
AU  - Santosh Kumar Yadav
AU  - Alok Shukla
AU  - Subhabrata Dhar
PY  - 2024
UR  - https://arxiv.org/abs/2404.13007
ID  - 2404.13007
ER  -