@misc{indiciae36178f19ea10,
  title = {Time-Gated Optical Spectroscopy of Field-Effect Stimulated Recombination via Interfacial Point Defects in Fully-Processed Silicon Carbide Power MOSFETs},
  author = {Maximilian W. Feil and Magdalena Weger and Hans Reisinger and Thomas Aichinger and André Kabakow and Dominic Waldhör and Andreas C. Jakowetz and Sven Prigann and Gregor Pobegen and Wolfgang Gustin and Michael Waltl and Michel Bockstedte and Tibor Grasser},
  year = {2024},
  doi = {10.1103/physrevapplied.22.024075},
  url = {https://arxiv.org/abs/2404.13463},
  note = {Source identifier: 2404.13463}
}