TY  - RPRT
TI  - Beyond Scaling: Predicting Patent Approval with Domain-specific Fine-grained Claim Dependency Graph
AU  - Xiaochen Kev Gao
AU  - Feng Yao
AU  - Kewen Zhao
AU  - Beilei He
AU  - Animesh Kumar
AU  - Vish Krishnan
AU  - Jingbo Shang
PY  - 2024
UR  - https://arxiv.org/abs/2404.14372
ID  - 2404.14372
ER  -