@misc{indiciae58a06e4a3c1e,
  title = {Iterative Cluster Harvesting for Wafer Map Defect Patterns},
  author = {Alina Pleli and Simon Baeuerle and Michel Janus and Jonas Barth and Ralf Mikut and Hendrik P. A. Lensch},
  year = {2024},
  url = {https://arxiv.org/abs/2404.15436},
  note = {Source identifier: 2404.15436}
}