TY  - RPRT
TI  - Easy over Hard: A Simple Baseline for Test Failures Causes Prediction
AU  - Zhipeng Gao
AU  - Zhipeng Xue
AU  - Xing Hu
AU  - Weiyi Shang
AU  - Xin Xia
PY  - 2024
DO  - 10.1145/3663529.3663850
UR  - https://arxiv.org/abs/2405.02922
ID  - 2405.02922
ER  -