@misc{indiciae2b98ae97e9d2,
  title = {Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures},
  author = {Efe Cakar and H. Ekmel Ercan and Gordian Fuchs and Artem O. Denisov and Christopher R. Anderson and Mark F. Gyure and Jason R. Petta},
  year = {2024},
  doi = {10.1063/5.0217704},
  url = {https://arxiv.org/abs/2405.03596},
  note = {Source identifier: 2405.03596}
}