TY  - RPRT
TI  - Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures
AU  - Efe Cakar
AU  - H. Ekmel Ercan
AU  - Gordian Fuchs
AU  - Artem O. Denisov
AU  - Christopher R. Anderson
AU  - Mark F. Gyure
AU  - Jason R. Petta
PY  - 2024
DO  - 10.1063/5.0217704
UR  - https://arxiv.org/abs/2405.03596
ID  - 2405.03596
ER  -