@misc{indiciae5b53823eb64a,
  title = {Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays},
  author = {Ryutaro Nishimura and Shunji Kishimoto and Toshihiko Sasaki and Shingo Mitsui and Masayoshi Shinya and Yasuo Arai and Toshinobu Miyoshi},
  year = {2024},
  doi = {10.1016/j.nima.2020.164380},
  url = {https://arxiv.org/abs/2405.08321},
  note = {Source identifier: 2405.08321}
}