@misc{indiciae2303299d3dfd,
  title = {Reducing Mid-Circuit Measurements via Probabilistic Circuits},
  author = {Yanbin Chen and Innocenzo Fulginiti and Christian B. Mendl},
  year = {2024},
  doi = {10.1109/qce60285.2024.00114},
  url = {https://arxiv.org/abs/2405.13747},
  note = {Source identifier: 2405.13747}
}