TY  - RPRT
TI  - Reducing Mid-Circuit Measurements via Probabilistic Circuits
AU  - Yanbin Chen
AU  - Innocenzo Fulginiti
AU  - Christian B. Mendl
PY  - 2024
DO  - 10.1109/qce60285.2024.00114
UR  - https://arxiv.org/abs/2405.13747
ID  - 2405.13747
ER  -