@misc{indiciaebf658e972ab6,
  title = {StyleX: A Trainable Metric for X-ray Style Distances},
  author = {Dominik Eckert and Christopher Syben and Christian Hümmer and Ludwig Ritschl and Steffen Kappler and Sebastian Stober},
  year = {2024},
  url = {https://arxiv.org/abs/2405.14718},
  note = {Source identifier: 2405.14718}
}