TY  - RPRT
TI  - Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS
AU  - Gerd Kiene
AU  - Sadik Ilik
AU  - Luigi Mastrodomenico
AU  - Masoud Babaie
AU  - Fabio Sebastiano
PY  - 2024
UR  - https://arxiv.org/abs/2405.17685
ID  - 2405.17685
ER  -