TY  - RPRT
TI  - Design of reliable technology valuation model with calibrated machine learning of patent indicators
AU  - Seunghyun Lee
AU  - Janghyeok Yoon
AU  - Jaewoong Choi
PY  - 2024
UR  - https://arxiv.org/abs/2406.05446
ID  - 2406.05446
ER  -