@misc{indiciaeafb871e03a47,
  title = {A Comprehensive Survey on Machine Learning Driven Material Defect Detection},
  author = {Jun Bai and Di Wu and Tristan Shelley and Peter Schubel and David Twine and John Russell and Xuesen Zeng and Ji Zhang},
  year = {2025},
  doi = {10.1145/3730576},
  url = {https://arxiv.org/abs/2406.07880},
  note = {Source identifier: 2406.07880}
}