TY  - RPRT
TI  - A Comprehensive Survey on Machine Learning Driven Material Defect Detection
AU  - Jun Bai
AU  - Di Wu
AU  - Tristan Shelley
AU  - Peter Schubel
AU  - David Twine
AU  - John Russell
AU  - Xuesen Zeng
AU  - Ji Zhang
PY  - 2025
DO  - 10.1145/3730576
UR  - https://arxiv.org/abs/2406.07880
ID  - 2406.07880
ER  -